Conference paper · Semiconductors
Metrology, Inspection, and Process Control XL · 8 April 2026
Stefan Schoeche; Aron Cepler; Marjorie Cheng et al.
Journal article · Capital & markets
Herald of Economics · 8 April 2026
Oleksandr Dziubliuk
Journal article · Industrial systems
International Journal of Applied Research in Business and Management · 8 April 2026
Salami Abdul Mohammed
Journal article · Semiconductors
Journal of the Society for Information Display · 8 April 2026
Yukinori Shima; Daisuke Kurosaki; Masami Jincho et al.
Journal article · Energy & infrastructure
International Journal of Advanced Research in Science Communication and Technology · 8 April 2026
Gurram Spoorthy, Vadla Kumar, Sriramula Abhinay
Conference paper · Semiconductors
Metrology, Inspection, and Process Control XL · 8 April 2026
Hankyul Koh; Jonghwan Seo; Jiwon Yun et al.
Conference paper · Semiconductors
Metrology, Inspection, and Process Control XL · 8 April 2026
Shlomit Katz; Philippe Leray; Hongcheon Yang et al.
Conference paper · AI & compute
2026 Communication Strategies in Digital Society Seminar (ComSDS) · 8 April 2026
Denis Shakhov; Vadim Islamutdinov; Alexey Isavnin et al.
Conference paper · Semiconductors
Metrology, Inspection, and Process Control XL · 8 April 2026
Yonghyeon Kim; Kunho Lee; Jungsu Son et al.
Journal article · Energy & infrastructure
Annales Geophysicae · 8 April 2026
Vanina Lanabere; Andrew P. Dimmock; Sven Molenkamp Venholen et al.
Journal article · Energy & infrastructure
Advances in Theoretical & Computational Physics · 8 April 2026
Valentina Markova
Journal article · Semiconductors
PLOS One · 8 April 2026
Sharith Dhar; Fahmid Al Farid; Md Saiful Islam et al.